Prof. A. David BASSIR

Belfort-Montbéliard University

Quality control is very important aspect in Building Information Modeling (BIM) workflows. Whatever stage of the lifecycle it is important to get and to follow building indicators. In the BIM it is very data consuming field and analysis of these data require advance numerical tool tools from image processing to big data analysis. Artificial intelligent (AI) and Machine Learning (ML) had proven their efficiency to deal with automate processes and extract useful sources of data in different industries. In addition to the indicators tracking, AI and ML can make a good prediction about when and where to provide maintenance and/or quality control. In this article, a review of the AI and ML application in BIM with a focus on quality control aspect will be presented. Further suggestions and challenges will be also discussed.

Prof. David Bassir is Professor at the French University of Technology and Senior Researcher at ENS-Université Paris-Saclay. He holds MSc and PhD in structural optimization from University of Franche-Comte. His administrative positions and duties included Dean at University Institutes of Technology, University of Lorraine, Consul of Science and Technology at the French Embassy in China, General Director of Research at the ESTP-ENSAM (Paris), Space Craft engineer at GECI Technology in different Space Agencies such as Arianespace (France) and (Astrium Group) and more. Prof. Bassir was an invited visiting professor in leading universities, including TUDelft, Shanghai Jiaotong, Northwestern Polytechnical, University of Oviedo, MIT Boston and Chinese Academy of Sciences. He published over 120 papers in journals, books and conference proceedings on various subjects of Composites materials, Parameter identification, Additive manufacturing, Structural Optimization and Multiscale modelling and analysis. He serves as member of various expert committees in many international organizations and highly estimated scientific societies. Since 2012, he is the founder and the president of the Sino-French Association for Sciences and Technology.